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Sources of Bias in EDA Tools and Its Influence

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F14%3A00217586" target="_blank" >RIV/68407700:21240/14:00217586 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/DDECS.2014.6868803" target="_blank" >http://dx.doi.org/10.1109/DDECS.2014.6868803</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/DDECS.2014.6868803" target="_blank" >10.1109/DDECS.2014.6868803</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Sources of Bias in EDA Tools and Its Influence

  • Original language description

    In this paper we present an experimental analysis of robustness of Electronic Design Automation (EDA) tools, with respect to different seemingly unimportant aspects (bias) introduced by the designer, ?from outside?. The algorithms employed in EDA tools should be immune to these completely, since such aspects do not carry any useful information ? source files differing in these aspects are semantically equivalent. However, we show that most of the studied tools are seriously sensitive here, much more than ever reported. The results indicate, that experiments conducted to evaluate the performance of EDA tools must take such behavior into consideration. Also the notion of a benchmark is questioned.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

  • ISBN

    978-1-4799-4558-0

  • ISSN

    2334-3133

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    258-261

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Warsaw

  • Event date

    Apr 23, 2014

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000346734200053