All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Degradation of Adhesive Bonds with Short Current Pulses

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F03%3A03090303" target="_blank" >RIV/68407700:21340/03:03090303 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Degradation of Adhesive Bonds with Short Current Pulses

  • Original language description

    Degradation of adhesive bonds powered by rectangular very short current pulses of the width of 1 microsec. and frequency of 1 kHz of high amplitude has been examined. The amplitudes of the pulses have been 5 and 10 A.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    26th International Spring Seminar on Electronics Technology

  • ISBN

    0-7803-8002-9

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    339-343

  • Publisher name

    Technical University of Košice

  • Place of publication

    Košice

  • Event location

    High Tatras, Slovakia

  • Event date

    May 8, 2003

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article