All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Optical Absorption Loss at Nano-Rough Silver Back Reflector of Thin Film Silicon Solar Cells

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F05%3A04114884" target="_blank" >RIV/68407700:21340/05:04114884 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optical Absorption Loss at Nano-Rough Silver Back Reflector of Thin Film Silicon Solar Cells

  • Original language description

    Absorption losses in rough silver back reflectors were measured, with a high precision in the spectral region of interest for silicon thin film solar cells. Absorption loss did not scale directly with an increasing surface roughness and the saturation isobserved. Photothermal deflection spectroscopy proved to be a useful tool for this study. According to our modeled results, short circuit current reduction due to surface plasmon absorption is about 0.5 mA/cm2 for thin &#61549;c-Si cells.

  • Czech name

    Ztráty ve slunečních článcích se stříbrným zadním reflektorem způsobené optickou absorpcí

  • Czech description

    Absorption losses in rough silver back reflectors were measured, with a high precision in the spectral region of interest for silicon thin film solar cells. Absorption loss did not scale directly with an increasing surface roughness and the saturation isobserved. Photothermal deflection spectroscopy proved to be a useful tool for this study. According to our modeled results, short circuit current reduction due to surface plasmon absorption is about 0.5 mA/cm2 for thin &#61549;c-Si cells.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    CTU Reports - Proceedings of Workshop 2005

  • ISBN

    80-01-03201-9

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    80-81

  • Publisher name

    Czech Technical University

  • Place of publication

    Prague

  • Event location

    Praha

  • Event date

    Mar 21, 2005

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article