Characterization of Si/Fe Multilayers by Electron Spectroscopy and Small Angle X-ray Scattering
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F06%3A04127753" target="_blank" >RIV/68407700:21340/06:04127753 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of Si/Fe Multilayers by Electron Spectroscopy and Small Angle X-ray Scattering
Original language description
The formation of Si/Fe multilayers has been studied by a variety of surface-sensitive techniques, such as Auger electron spectroscopy, electron-energy-loss spectroscopy, and small-angle X-ray scattering.
Czech name
Charakterizace Si/Fe multivrstev metodami elektronové spektroskopie a SAXS
Czech description
Fe/Si multivrstvy byly studovány celou řadou technik, především Augerovou elektronovou spektroskopií, elektronovou spektroskopií charakteristických ztrát a maloúhlovým rozptylem rentgenového záření.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2006
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
The Physics of Metals and Metallography
ISSN
0031-918X
e-ISSN
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Volume of the periodical
101
Issue of the periodical within the volume
1
Country of publishing house
US - UNITED STATES
Number of pages
3
Pages from-to
78-80
UT code for WoS article
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EID of the result in the Scopus database
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