Lu3Al5O12-Based Materials for High 2D-Resolution Scintillation Detectors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F09%3A00166936" target="_blank" >RIV/68407700:21340/09:00166936 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Lu3Al5O12-Based Materials for High 2D-Resolution Scintillation Detectors
Original language description
About 20 micrometers thick Ce-doped Lu3Al5O12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to micrometer2D-resolution. Their scintillation response is also measured under alpha-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE on CD-ROM, Defense, Security and Sensing
ISBN
978-0-8194-7621-0
ISSN
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e-ISSN
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Number of pages
3
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
Orlando
Event date
Apr 13, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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