Phase Transition Study of NaNbO3 Thin Films by Spectral Ellipsometry

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F10%3A00166110" target="_blank" >RIV/68407700:21340/10:00166110 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Phase Transition Study of NaNbO3 Thin Films by Spectral Ellipsometry
Original language description
In this work the thermo-optical properties at the wide temperature range (5-820 K) of sodium niobate NaNbO3 (NN) thin films were investigated by means of the spectroscopic ellipsometry. NN thin films were deposited by the pulsed laser ablation techniqueon Si/SiO2/Ti/Pt/SrRuO3 substrates. Temperature dependence of complex refractive index dispersions and optical bang energy of direct allowed electron transitions were evaluated. Additionally dynamic scans of main ellipsometric angles at several fixed wavelengths of 300, 400, 500 and 635 nm were performed to acquire more detailed temperature dependencies of refractive index and extinction coefficient. Pronounced minima/maxima and substantial jumps in the temperature dependence of complex refractive indexand band gap energy were found and are corresponded to the structural phase transition temperatures of NN single crystals and ceramics. Observed negative thermo-optical effect in NN films is discussed as well.
Czech name
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Czech description
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Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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