Measurement of Characteristics of a XUV Capillary Laser

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F11%3A00187080" target="_blank" >RIV/68407700:21340/11:00187080 - isvavai.cz</a>
Result on the web
<a href="http://www.spie.org" target="_blank" >http://www.spie.org</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.886758" target="_blank" >10.1117/12.886758</a>

Result language
angličtina
Original language name
Measurement of Characteristics of a XUV Capillary Laser
Original language description
This work concerns in measurement of characteristics of a XUV argon capillary laser, which was developed at the Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering. This laser generates at 46.9 nm in Ne - like Ar. Young's double pinhole experiment was realized to estimate spatial coherence of this laser system and to detect the beam profile. We used double pinhole drilled by Ti:saphire laser with four different pinhole separations. pinhole separations were 50 mu m,60 mu m and 150 mu m. Apertures had oval shape with diameter 20 - 52 mu m. Interference structure was detected XUV CCD camera with resolution 512x512 pixels. This work contains also short overview about sources of XUV radiation.
Czech name
—
Czech description
—

Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE II
ISBN
9780819486660
ISSN
0277-786X
e-ISSN
—
Number of pages
6
Pages from-to
"80760L"
Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
Prague
Event date
Apr 20, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
000297594500018

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