Optical Element for X-ray Microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F12%3A00193957" target="_blank" >RIV/68407700:21340/12:00193957 - isvavai.cz</a>
Result on the web
<a href="https://data.epo.org/publication-server/rest/v1.0/publication-dates/20120606/patents/EP2168130NWB1/document.pdf" target="_blank" >https://data.epo.org/publication-server/rest/v1.0/publication-dates/20120606/patents/EP2168130NWB1/document.pdf</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Optical Element for X-ray Microscopy
Original language description
Presented solution deals with an X-ray optical element suitable in particular for X-ray microscopy and other X-ray-based display systems. Disadvantages of known setups are improved by an optical set-up exploiting a monocrystal, which displays X-ray radiation with wavelength ? according to the presented solution. This set-up consists of at least one monocrystal with atomic planes in parallel with optical axis, it means with a line connecting the point to be displayed with the center of its image.
Czech name
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Czech description
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Classification
Type
P - Patent
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Patent/design ID
EP2168130
Publisher
EPO_1 -
Publisher name
European Patent Office
Place of publication
Munich, The Hague, Berlin, Vienna, Brussels
Publication country
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Date of acceptance
Jun 6, 2012
Owner name
České vysoké učení technické v Praze, Fakulta jaderná a fyzikálně-inženýrská
Method of use
A - Výsledek využívá pouze poskytovatel
Usage type
P - Využití výsledku jiným subjektem je v některých případech možné bez nabytí licence