The Calibration of a Conventional X-ray Fluorescence Analyzer for Depth Profiling

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F15%3A00235304" target="_blank" >RIV/68407700:21340/15:00235304 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
The Calibration of a Conventional X-ray Fluorescence Analyzer for Depth Profiling
Original language description
The X-ray fluorescence analysis (XRF) is established as a technique for the determination of depth distribution of elements. In certain applications, the confocal modality cannot be used, there is a possibility of the conventional XRF. These applicationsare mostly performed in the research of cultural heritage objects where portable device for analysis is demanded. The Ka/Kb or La/M X-ray lines ratios where used for obtaining calibration diagrams of different depth distributions of the elements. The principle of the proposed Ka/Kb technique lies in the different absorption coefficients for the Ka and Kb lines. If an element is present at some depth, its characteristic radiation has to penetrate through thick layer of the matrix, and the characteristicX-ray fluxes are significantly changed. The depth of the layer can be described by K?/K? ratio of an element; i.e. lower ratio indicates deeper position. The experimental part includes measurements of standards of several elements from t
Czech name
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Czech description
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Project
<a href="/en/project/DF12P01OVV034" target="_blank" >DF12P01OVV034: Physical and chemical analytical methods, their application in the research of collection items of the National Technical Museum with regard to their restoration and preventive conservation</a><br>
Continuities
S - Specificky vyzkum na vysokych skolach

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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