MICRODOSIMETRY FOR A CARBON ION BEAM USING TRACK-ETCHED DETECTORS

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F15%3A00236159" target="_blank" >RIV/68407700:21340/15:00236159 - isvavai.cz</a>
Alternative codes found
RIV/61389005:_____/15:00450487
Result on the web
<a href="http://dx.doi.org/10.1093/rpd/ncv131" target="_blank" >http://dx.doi.org/10.1093/rpd/ncv131</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1093/rpd/ncv131" target="_blank" >10.1093/rpd/ncv131</a>

Result language
angličtina
Original language name
MICRODOSIMETRY FOR A CARBON ION BEAM USING TRACK-ETCHED DETECTORS
Original language description
Track-etched detectors (TED) have been used as linear energy transfer (LET) spectrometers in heavy ion beams for many years. LET spectra and depth?dose distribution of a carbon ion beam were measured behind polymethylmethacrylate degraders at Heavy Ion Medical Accelerator in Chiba, Japan. The measurements were performed along monoenergetic beam with energy 290 MeV u-1 in different positions: (1) at beam extraction area, (2) at beginning, (3) maximum and (4) behind the Bragg peak region (0, 117, 147 and151 mm of water-equivalent depth, respectively). The LET spectra inside and outside of the primary ion beam have been evaluated. TED record only heavy charged particles with LET above 8-10 keV ?m-1, while electrons and ions with lower LET are not detected. The Geant4 simulation toolkit version 4.9.6.P01 has been used to estimate the contribution of non-detected particles to absorbed dose. Presented results demonstrate the applicability of TED for microdosimetry measurements in therapeuti
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
S - Specificky vyzkum na vysokych skolach

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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