Space optics with silicon wafers and slumped glass

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F17%3A00369329" target="_blank" >RIV/68407700:21340/17:00369329 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1117/12.2308249" target="_blank" >https://doi.org/10.1117/12.2308249</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2308249" target="_blank" >10.1117/12.2308249</a>

Result language
angličtina
Original language name
Space optics with silicon wafers and slumped glass
Original language description
The future space X-ray astronomy imaging missions require very large collecting areas at still fine angular resolution and reasonable weight. The novel substrates for X-ray mirrors such as Silicon wafers and thin thermally formed glass enable wide applications of precise and very light weight (volume densities 2.3 to 2.5 gcm-3) optics. The recent status of novel technologies as well as developed test samples with emphasis on precise optical surfaces based on novel materials and their space applications is presented and discussed.
Czech name
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Czech description
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Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proc. SPIE 10566, International Conference on Space Optics — ICSO 2008
ISBN
978-1-5106-1621-9
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
8
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
Toulouse
Event date
Oct 14, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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