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Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F18%3A00374254" target="_blank" >RIV/68407700:21340/18:00374254 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1109/NSSMIC.2018.8824486" target="_blank" >https://doi.org/10.1109/NSSMIC.2018.8824486</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/NSSMIC.2018.8824486" target="_blank" >10.1109/NSSMIC.2018.8824486</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC

  • Original language description

    The RD53A large scale pixel demonstrator chip has been developed in 65 nm CMOS technology by the RD53 collaboration, in order to face the unprecedented design requirements of the pixel 2 phase upgrades of the CMS and ATLAS experiments at CERN. This prototype chip is designed to demonstrate that a set of challenging specifications can be met, such as: high granularity (small pixels of 50x50 or 25x100 mu m(2)) and large pixel chip size (similar to 2x2 cm(2)), high hit rate (3 GHz/cm(2)), high readout speed, very high radiation levels (500 Mrad - 1 Grad) and operation with serial powering. Furthermore, coping with the long latency of the trigger signal (similar to 12.5 mu s), used to select only events of interest in order to achieve sustainable output data rates, requires increased buffering resources in the limited pixel area. The RD53A chip has been fabricated in an engineer run. It integrates a matrix of 400x192 pixels and features various design variations in the analog and digital pixel matrix for testing purposes. This paper presents an overview of the chip architecture and of the methodologies used for efficient design of large complex mixed signal chips for harsh radiation environments. Experimental results obtained from the characterization of the RD53A chip are reported to demonstrate that design objectives have been achieved. Moreover, design improvements and new features being developed in the RD53B framework for final ATLAS and CMS production chips are discussed.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC)

  • ISBN

    978-1-5386-8494-8

  • ISSN

    2577-0829

  • e-ISSN

    2577-0829

  • Number of pages

    4

  • Pages from-to

    1-4

  • Publisher name

    Institute of Electrical and Electronics Engineers, Inc.

  • Place of publication

  • Event location

    Sydney

  • Event date

    Nov 10, 2018

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000601256000220