Overview of methods for determining the depth distribution of elements in X-ray fluorescence analysis

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F22%3A00360856" target="_blank" >RIV/68407700:21340/22:00360856 - isvavai.cz</a>

Result on the web

<a href="https://doi.org/10.1016/j.radphyschem.2022.110388" target="_blank" >https://doi.org/10.1016/j.radphyschem.2022.110388</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.radphyschem.2022.110388" target="_blank" >10.1016/j.radphyschem.2022.110388</a>

Result language

angličtina

Original language name

Overview of methods for determining the depth distribution of elements in X-ray fluorescence analysis

Original language description

X-ray fluorescence analysis is a frequently used analytical method in a number of areas for many decades, including the research of objects of cultural heritage. Especially in this area, the irreplaceable advantage is the fact that the measurement can be performed non-destructively and non-invasively on the examined object as a whole. It affects only a relatively thin layer at the surface of the object under investigation, nevertheless, this layer can have a complex structure (various coatings, gilding or other metallization, paint layers, etc.). Infor-mation about it can be a valuable contribution both to historical knowledge and to restoration work. During the development of the method, therefore, several procedures were elaborated to estimate the homogeneity or possible inhomogeneities of the investigated layer. In principle, the simplest one is to measure at different beam angles. However, this also changes the depth in the material into which the radiation penetrates. Without changing the measurement geometry, it is possible to use simultaneous detection of two different energy lines of the characteristic radiation of the investigated element (e.g., K alpha and K beta) and to evaluate the depth distribution on the basis of their ratio. Finally, the most sophisticated, but also the most informative, is the confocal arrangement of the spectrometer, where the focus, i.e. the intersection of the beams of incident and emitted radiation very narrowly collimated by the capillary optics, shifts to the depth of the measured material. This review paper summarizes the principles and possibilities of these methods, their advantages and limitations, and thus gives information for their use for specific needs. The use is illustrated by examples of specific measurements of art objects, realized in various laboratories, but especially in the laboratory of the authors of this paper.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Project

<a href="/en/project/EF16_019%2F0000778" target="_blank" >EF16_019/0000778: Center for advanced applied science</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2022

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Radiation Physics and Chemistry

ISSN

0969-806X

e-ISSN

1879-0895

Volume of the periodical

200

Issue of the periodical within the volume

110388

Country of publishing house

GB - UNITED KINGDOM

Number of pages

7

Pages from-to

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UT code for WoS article

000869139300013

EID of the result in the Scopus database

2-s2.0-85134564121