Nd:YAG/Cr:YAG microchip-based system for laser-induced damage threshold measurement
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F23%3A00367171" target="_blank" >RIV/68407700:21340/23:00367171 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1117/12.2647845" target="_blank" >https://doi.org/10.1117/12.2647845</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2647845" target="_blank" >10.1117/12.2647845</a>
Alternative languages
Result language
angličtina
Original language name
Nd:YAG/Cr:YAG microchip-based system for laser-induced damage threshold measurement
Original language description
A compact system for measuring laser-induced damage threshold (LIDT) was developed. As a source of linearly polarized 1064nm testing radiation, the special Q-switched microchip laser was used. This laser was based on monolith crystal composed of Nd:YAG active laser part and Cr:YAG saturable absorber. The laser generates 3.9 ns long pulses with an energy of 0.42mJ and repetition rate of 50 Hz. The LIDT measurement uses computer-controlled attenuator and sample 3D positioner. The system was designed to test transparent samples with a diameter of up to 25 mm. The system was tested for silica glass and YAG crystal. It is assumed that this system will be used for routine control of LIDT of dielectric layers on laser crystals and mirrors.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/FW01010219" target="_blank" >FW01010219: Multicomponent single crystal materials for solid state lasers</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proc. SPIE 12399, Solid State Lasers XXXII: Technology and Devices
ISBN
9781510659032
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
6
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
San Francisco, California
Event date
Jan 28, 2023
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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