Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F07%3A12130214" target="_blank" >RIV/68407700:21460/07:12130214 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter
Original language description
t the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si=C multilayers with fluxes up to 3 1014 W=cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3A°. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, givingcredence to the concept of diffraction imaging of single macromolecules.
Czech name
Měření interakcí ultrarychlých rentgenových bezelektronových laserových pulsů s hmotou v subnanometrickém měřítku
Czech description
Měření interakcí ultrarychlých rentgenových bezelektronových laserových pulsů s hmotou v subnanometrickém měřítku.

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Project
<a href="/en/project/KAN300100702" target="_blank" >KAN300100702: Creating and probing nanostructures with X-ray lasers</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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