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Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F08%3A15152671" target="_blank" >RIV/68407700:21670/08:15152671 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip

  • Original language description

    3D silicon sensors with electrodes penetrating the full substrate thickness, different electrode configurations and with active edges, where bump-bonded to the ATLAS pixel readout chip FE-I3 in 2006. Their characterization included electrical tests in laboratory, tests with beam and radioactive sources. Noise figures after bump bonding varied from 190 to 290 electrons, in agreement with the different electrode density of the three 3D configurations. This paper will reports beam results on the edge sensitivity, electrode response and efficiency at different angles of 3D sensors, fabricated at Stanford and bump-bonded to the ATLAS FE-I3 front end chip, before and after irradiation to 1015 high energy protons per cm2.

  • Czech name

    Charakterizace hran 3D kremikoveho detektoru po Bump-Bondingu s ATLAS Pixel Readout Chipem

  • Czech description

    Clanek pojednava o charakterizaci hran 3D kremikoveho detektoru po Bump-Bondingu s ATLAS Pixel Readout Chipem

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BG - Nuclear, atomic and molecular physics, accelerators

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Conference Record of the 2008 IEEE NSS/MIC/RTSD

  • ISBN

    978-1-4244-2715-4

  • ISSN

    1082-3654

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

  • Publisher name

    Omipress

  • Place of publication

    Wisconsin

  • Event location

    Dresden

  • Event date

    Oct 19, 2008

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article