Back-side pulse and cluster processing for particle traces measured by pixel detector

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F09%3A00166880" target="_blank" >RIV/68407700:21670/09:00166880 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Back-side pulse and cluster processing for particle traces measured by pixel detector

Original language description

Semiconductor pixel detector of ionizing radiation can detect traces of individual ionizing particles. These traces are seen as clusters of pixels with signal. The cluster shape is effected by charge sharing effect in detector and by particle properties.By proper analysis of cluster shape it is possible to determine the type, energy and in some cases even impact angle of the particle. The software can perform complex analysis and evaluation of measured traces.

Czech name

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Czech description

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Type

R - Software

CEP classification

BG - Nuclear, atomic and molecular physics, accelerators

OECD FORD branch

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Project

<a href="/en/project/LC06041" target="_blank" >LC06041: Preparation, modification and characterization of materials by energetic radiation.</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Internal product ID

BSpulse

Technical parameters

Requirements: MS Windows OS, Pixelman package

Economical parameters

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Owner IČO

68407700

Owner name

České vysoké učení technické v Praze, ÚTEF