Low dose X-ray phase contrast imaging sensitive to phase effects in 2-D

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F10%3A00225862" target="_blank" >RIV/68407700:21670/10:00225862 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5874172" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5874172</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/NSSMIC.2010.5874172" target="_blank" >10.1109/NSSMIC.2010.5874172</a>

Result language
angličtina
Original language name
Low dose X-ray phase contrast imaging sensitive to phase effects in 2-D
Original language description
X-ray absorption imaging is a widespread imaging technique in biology and industry as well as diagnostic imaging of the human body in medicine. However, in many situations, there is the need to distinguish between low absorption and even low contrast features such as cancerous and normal tissue in mammography. In this case, the applicability of conventional absorption imaging is limited. X-ray phase contrast imaging (XPCI) is a powerful imaging technique providing enhanced contrast since the real (phase) part ? of the refractive index (1-?-i?) is several orders of magnitude larger than the imaginary (absorption) part ?. In our previous work, we introduced a new XPCI method based on precise sub-pixel position determination of the X-ray pattern projectedby the grating directly from the pattern image enabling to achieve high-quality 1-D phase and absorption images simultaneously in a single exposition. In this contribution, we present the extension of our 1-D single grating method to 2-D
Czech name
—
Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)
ISBN
978-1-4244-9106-3
ISSN
1095-7863
e-ISSN
—
Number of pages
2
Pages from-to
2200-2201
Publisher name
IEEE
Place of publication
Piscataway (New Jersey)
Event location
Knoxville (Tennessee)
Event date
Oct 30, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000306402902078

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