Probe and scanning system for 3D response mapping of pixelated semiconductor detector with X-rays and the timepix device
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F11%3A00191950" target="_blank" >RIV/68407700:21670/11:00191950 - isvavai.cz</a>
Result on the web
<a href="http://aladdin.utef.cvut.cz/ofat/others/slit/index.html" target="_blank" >http://aladdin.utef.cvut.cz/ofat/others/slit/index.html</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Probe and scanning system for 3D response mapping of pixelated semiconductor detector with X-rays and the timepix device
Original language description
The principle of this system is based on the use of a collimated parallel X-ray beam with a line profile, which delivers a defined charge at a specific location in 3D in the sensor. The beam can be sent onto the pixelated sensor at a low angle, which allows determining, for a given angle and detector position, the depth of interaction for each pixel. Shifting the detector along the axis perpendicular to the plane of the beam we can obtain a map of the detector response which is in 3D-i.e. both across the sensor plane and along its depth.
Czech name
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Czech description
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Classification
Type
G<sub>funk</sub> - Functional sample
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LC06041" target="_blank" >LC06041: Preparation, modification and characterization of materials by energetic radiation.</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Internal product ID
Štěrbina
Numerical identification
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Technical parameters
7 stupňů volnosti, šířka štěrbiny jednotky mikrometrů
Economical parameters
pořizovací náklady 100 000,- Kč
Application category by cost
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Owner IČO
68407700
Owner name
ČVUT ÚTEF
Owner country
CZ - CZECH REPUBLIC
Usage type
P - Využití výsledku jiným subjektem je v některých případech možné bez nabytí licence
Licence fee requirement
Z - Poskytovatel licence na výsledek nepožaduje v některých případech licenční poplatek
Web page
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