Dynamics of Charge Collection in Pixelated Semiconductor Sensor Studied with Heavy Ions and Timepix
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F12%3A00204235" target="_blank" >RIV/68407700:21670/12:00204235 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Dynamics of Charge Collection in Pixelated Semiconductor Sensor Studied with Heavy Ions and Timepix
Original language description
This paper presents a novel technique allowing for the measurement and visualization of the spatial distribution and time evolution of the charge collection process in semiconductor sensors of ionizing radiation. The study was carried out with a pixelated high resistivity silicon sensor bump-bonded to the Timepix readout chip (256 x 256 pixels, with pitch of 55 ?m). The sensor was irradiated with energetic protons (132 MeV) and carbon ions (240MeV/u) entering the sensor at shallow angles. Such ions penetrate the full sensor thickness ionizing and depositing charge along their tracks. The charge deposited is collected by individual pixels of the Timepix chip operated in Time mode. The overall accuracy of these measurements was enhanced by averaging manyparticle tracks. The time accuracy is in order of nanoseconds and the position accuracy is about 5 ?m. The purpose of this work is to demonstrate the accurate measurement that may be used with the mathematical model to investigate the el
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
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Result continuities
Project
<a href="/en/project/TA01010237" target="_blank" >TA01010237: Facility for nondestructive testing, diagnostics and 3D imaging based on neutron radiography and tomography.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC)
ISBN
978-1-4673-2029-0
ISSN
1095-7863
e-ISSN
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Number of pages
4
Pages from-to
4184-4187
Publisher name
Institute of Electrical and Electronic Engineers
Place of publication
Piscataway
Event location
Anaheim
Event date
Oct 29, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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