Ionizing Energy Depositions After Fast Neutron Interactions in Silicon
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F16%3A00302434" target="_blank" >RIV/68407700:21670/16:00302434 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/document/7482701/" target="_blank" >http://ieeexplore.ieee.org/document/7482701/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TNS.2016.2574961" target="_blank" >10.1109/TNS.2016.2574961</a>
Alternative languages
Result language
angličtina
Original language name
Ionizing Energy Depositions After Fast Neutron Interactions in Silicon
Original language description
In this study we present the ionizing energy depositions in a 300 μm thick silicon layer after fast neutron impact. With the Time-of-Flight (ToF) technique, the ionizing energy deposition spectra of recoil silicons and secondary charged particles were assigned to (quasi-)monoenergetic neutron energies in the range from 180 keV to hundreds of MeV. We show and interpret representative measured energy spectra. By separating the ionizing energy losses of the recoil silicon from energy depositions by products of nuclear reactions, the competition of ionizing (IEL) and non-ionizing energy losses (NIEL) of a recoil silicon within the silicon lattice was investigated. The data give supplementary information to the results of a previous measurement and are compared with different theoretical predictions.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
—
Result continuities
Project
—
Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
IEEE Transactions on Nuclear Science
ISSN
0018-9499
e-ISSN
—
Volume of the periodical
63
Issue of the periodical within the volume
4
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
2372-2378
UT code for WoS article
000382469200015
EID of the result in the Scopus database
2-s2.0-84984677464