Specifications of Measuring Probes in the Near Zone of Mechatronic Systems

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F12%3A43867859" target="_blank" >RIV/70883521:28140/12:43867859 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Specifications of Measuring Probes in the Near Zone of Mechatronic Systems

Original language description

This report brings you the essential knowledge and findings regarding the measurement of microwave antenna parameters in the near zone mechatronic systems. The goal of this report is to give you an overview of the advantages and disadvantages of the nearzone measurement process and comparison with measurements performed in the distant zone. Probes with low gain offer advantages from a calculation point of view, because is often unnecessary to perform compensation of the probe during calculation. This is true mostly for cylindrical and spherical scanning (spherical scanning is even less sensitive to the probe influence then cylindrical scanning).

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Publication year

2012

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Sborník přednášek a příspěvků

ISBN

978-80-01-05060-6

ISSN

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e-ISSN

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Number of pages

6

Pages from-to

191-196

Publisher name

ČVUT

Place of publication

Praha

Event location

Tábor

Event date

Jun 4, 2012

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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