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201 181 (0,281s)

Result

RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils

RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils...

CD - Makromolekulární chemie

  • 2005
  • Jx
Result

Composition profiling of piezoelectric PZT thin films deposited onto Cu coated polymer substrates

been employed foralternatively the Zr- or Ti-target. Composition analysis and profiling was performed by means of X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering (RBS). RBS data was recalibrat...

Electrical and electronic engineering

  • 2012
  • D
Result

RBS and XPS Study of TiOx Layers Prepared by PVD Technique

properties (hardness and thickness) were performed. We concluded from RBS analysis flow rate were changed. The samples prepared were analysed by RBS (Rutherford and by ERDA (Elastic Recoil Detection Analysis) to i...

BL - Fyzika plasmatu a výboje v plynech

  • 2003
  • Jx
Result

RBS and XPS studies of TiOx layers prepared using PVD technique.

properties (hardness and thickness) were performed. We concluded from RBS analysis flow rate were changed. The samples prepared were analysed by RBS (Rutherford and by ERDA (Elastic Recoil Detection Analysis) to i...

JK - Koroze a povrchové úpravy materiálu

  • 2004
  • Jx
Result

Titanium carbide/carbon nanocomposite hard coatings: A comparative study between various chemical analysis tools

of the films determined by different analysis techniques: X-ray photoelectron spectroscopy (XPS), Rutherford backscattering spectrometry (RBS), wavelength dispersive X-ray spectroscopy (WDS) and energy dispersive X-ray spe...

BL - Fyzika plasmatu a výboje v plynech

  • 2014
  • Jx
  • Link
Result

RBS, XPS and AFM Study of Ag Thin Films and Polyethylene Foils Interface Modified by Plasma Treatment

In this study, the effect of plasma treatment and annealing on the diffusion of Ag in low and high-density polyethylene (LDPE and HDPE, respectively) is examined....

BL - Fyzika plasmatu a výboje v plynech

  • 2007
  • D
Result

RBS and XPS measurements of Ag and Er implantation into the silica

. The depth distributions of implanted metal were investigated by RBS and XPS analytical...

BG - Jaderná, atomová a molekulová fyzika, urychlovače

  • 2009
  • D
Result

RBS and XPS study of TiOx layers prepared by the PVD technique .

. We concluded from RBS analysis that Ti content is enhanced according flow rate were varied. The prepared samples were analysed by RBS (Rutherford (elastic recoil detection analysis) to investigate the hydrogen co...

BM - Fyzika pevných látek a magnetismus

  • 2004
  • Jx
Result

Chemistry of plasma-polymerized vinyltriethoxysilane controlled by deposition conditions

Plasma-polymerized vinyltriethoxysilane films were analyzed by various spectroscopic techniques (RBS, ERDA, XPS, FTIR) in order to compare their chemical structure and composition....

BM - Fyzika pevných látek a magnetismus

  • 2008
  • Jx
Result

RBS and XPS Measurements of Ag and Er Implantation into the Silica Glass

spectroscopy (XPS) and the Rutherford Backscattering Spectrometry (RBS) with the 2.0 MeV He+ ions, the incoming angle was 0° while the scattering angle was 170°. XPS depth......

BM - Fyzika pevných látek a magnetismus

  • 2009
  • D
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