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Characterization of the boundaries of thin films of TiO.sub.2./sub. by atomic force microscopy and optical methods.

Identification of different WO3 modifications in thin films for photocatalytic applications by peak shape analysis in high temperature XRD diffractometry

Characterization of U-based thin films: the UFe(2+x) case

Laser created thin films sensors based on Sn- and indium compounds.

Measurement of mechanical properties of nanodiamond thin films

Optical characterization of non-uniform thin films using imaging spectrophotometry

Simultaneous determination of the elastic modulus and density/thickness of ultrathin films utilizing micro-/nanoresonators under applied axial force

Progress in Applied Surface, Interface and Thin Film Science 2015, SURFINT-SREN IV

Laser patterning of transparent polymers assisted by plasmon excitation

Solution processed As30Se70 chalcogenide glass thin films with specular optical quality: multi- component solvent approach