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New strategy in electrochemical investigation of DNA damage demonstrated on genotoxic derivatives of fluorene
In this work, a simple and fast electrochemical DNA biosensor based on a glassy-acetylaminofluorene (2-AAF), and 2,7-diaminofluorene (2,7-DAF). The electrochemical investigation of several electrochemical detection techniqu...
Analytical chemistry
- 2022 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Diagnostic of cathode materials for electrochemical power sources
This work deals with diagnostic of surface structure of cathode materials for electrochemical power sources prepared by different ways. For sample morphology diagnostic scanning electron microscopy methods were used. The scanning el...
CG - Elektrochemie
- 2015 •
- D
Rok uplatnění
D - Stať ve sborníku
A cost-efficient approach for simultaneous scanning electrochemical microscopy and scanning ion conductance microscopy
for performing simultaneous scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM) is presented. Coupling both techniques allows distinguishing topographical and electrochemical ...
Analytical chemistry
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
A cost‑efcient approach for simultaneous scanning electrochemical microscopy and scanning ion conductance microscopy
for performing simultaneous scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM) is presented. Coupling both techniques allows distinguishing topographical and electrochemical ...
Condensed matter physics (including formerly solid state physics, supercond.)
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Scanning Probe Microscopies in Electrochemistry.
Electrochemical applications of scanning probe microscopic techniques are reviewed. Advantages and limitations of these techniques are discussed and illustrated on examples from literature....
CF - Fyzikální chemie a teoretická chemie
- 2002 •
- C
Rok uplatnění
C - Kapitola v odborné knize
Edges of Layered FePSe3 Exhibit Increased Electrochemical and Electrocatalytic Activity Compared to Basal Planes
scanning electrochemical microscopy, we discovered that electrochemical processes of electrochemical and electrocatalytic activity at their edge and basal sites. To find out at these compounds, we studied the loca...
Electrical and electronic engineering
- 2023 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Electrochemical Deposition of Tin and Silicon Studied by EQCM
Silicon and Tin thin films were prepared by electrochemical deposition on copper and nickel substrates in the Atmosbag. Electrochemical activity is described by cyclic voltammetry and for studying increase of weight were used EQCM. ...
CG - Elektrochemie
- 2014 •
- D •
- Link
Rok uplatnění
D - Stať ve sborníku
Výsledek na webu
Electrochemical depositon of tin and silicon studied by EQCM
Silicon and Tin thin films were prepared by electrochemical deposition on copper and nickel substrates in the Atmosbag. Electrochemical activity is described by cyclic voltammetry and for studying increase of weight were used EQCM. ...
CG - Elektrochemie
- 2012 •
- D
Rok uplatnění
D - Stať ve sborníku
Characterization of copper SERS-active substrates prepared by electrochemical deposition
morphologies, prepared by electrochemical deposition on platinum targets, was investigated of the substrates was visualized by means of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). SERS spectra of ...
CB - Analytická chemie, separace
- 2009 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Surface diagnostic of electrodes used in electrochemical power source
This work deals with diagnostics of the influence of aging process on the surface morphology of the electrochemical sources based on nickel - zinc cell system. The scanning electron microscopy and the atomic force microscopy
JA - Elektronika a optoelektronika, elektrotechnika
- 2011 •
- D
Rok uplatnění
D - Stať ve sborníku
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