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Atomic force microscopy studies of cross-sections columnar thin films
Atomic force microscopy studies of cross-sections columnar thin films.
BM - Fyzika pevných látek a magnetismus
- 2007 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy.
Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Atomic force microscopy
The review article deals with a detail description of the atomic force microscopy with the intention of the feedback loops used to tip height regulation in various imaging modes....
JB - Senzory, čidla, měření a regulace
- 2009 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
We present dynamic force-microscopy experiment and first-principles simulations that contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy (KPFM) images of semiconducto...
BM - Fyzika pevných látek a magnetismus
- 2009 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
The Role of Atomic Force Microscopy in Nanoparticle Research
, was accompanied by another method, atomic force microscopy, based on scanning the sample microscopy, the application of atomic force microscopy offers the capability of three. In this r...
BM - Fyzika pevných látek a magnetismus
- 2010 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Characterization of nanostructures and nanoparticles using atomic force microscopy
Results on 1) surface morphology of nanocomposites and 2) characterization of surface-deposited nanoparticles, obtained by atomic force microscopy, are described....
JA - Elektronika a optoelektronika, elektrotechnika
- 2004 •
- D
Rok uplatnění
D - Stať ve sborníku
Atomic force microscopy in research and education
This contribution deals with the principle of the atomic force microscope and its employment in various branches of science and technology....
BM - Fyzika pevných látek a magnetismus
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles......
BM - Fyzika pevných látek a magnetismus
- 2007 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Theoretical analysis of the atomic force microscopy characterization of columnar thin films
In this paper a theoretical analysis of atomic force microscopy measurements of columnar thin films is presented. Errors originating from tip convoution effects are evaluated....
BM - Fyzika pevných látek a magnetismus
- 2003 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Mechanical Characterisation of HeLa Cells using Atomic Force Microscopy
Recently, atomic force microscopy (AFM) has been shown to be a suitable tool for imaging biological structures and their modification, adding to accurate morphological and cytomechanical information....
BO - Biofyzika
- 2012 •
- C
Rok uplatnění
C - Kapitola v odborné knize
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