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2 004 (0,106s) •

Result

XPS analyses of powder materials

XPS measurements and interpretation of the XPS spectra of hydrotalcite...

JJ - Ostatní materiály

  • 2015
    • •
  • Vsouhrn
Result

XPS analysis of valves VGB

XPS analysis of valve seats including ion etching and simple concentration profiles...

CI - Průmyslová chemie a chemické inženýrství

  • 2016
    • •
  • Vsouhrn
Result

Method for preparation of samples for characterization of surface by XPS

Research report named - Method for preparation of samples for characterization of surface by XPS...

CA - Anorganická chemie

  • 2015
    • •
  • Vsouhrn
Result

Application of XPS to Deposit Analysis

Application of XPS to Deposit Analysis for combustion chamber of waste incinerators, analysis of materials degradation...

CI - Průmyslová chemie a chemické inženýrství

  • 2005
    • •
  • O
Result

XPS measurements of samples

X-ray photoelectron spectroscopy (XPS) measurements of samples with ion odprašováním, chemical mapping...

CB - Analytická chemie, separace

  • 2016
    • •
  • Vsouhrn
Result

In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS

Degradation of PMPSi under teperature and UV light uder UHV conditions studied by XPS and spectroscopic ellipsometry.

BM - Fyzika pevných látek a magnetismus

  • 2003
    • •
  • D
Result

XP - eXtreme Programming, Method of software developing

The article deals with characteristic of basic principles the XP method and her success preconditions in practice...

BC - Teorie a systémy řízení

  • 2004
    • •
  • D
Result

Residual surface oxide on ZrV getter-XPS, LEIS and SIMS study

Residual surface oxide on ZrV getter-XPS, LEIS and SIMS study...

BM - Fyzika pevných látek a magnetismus

  • 2004
    • •
  • Jx
Result

Electron irradiated potassium-silicate glass surfaces investigated by XPS

Electron irradiated potassium-silicate glass surfaces investigated by XPS...

JH - Keramika, žáruvzdorné materiály a skla

  • 2005
    • •
  • Jx
Result

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS covers: (i) XPS data collection, initial data analysis, and data pre...

Chemical sciences

  • 2024
    • •
  • Jimp
    • •
  • Link
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