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Simulation of surface imaging using non-contact mode AFM
Simulation of non-contact mode AFM with atomic resolution and the limits of imaging.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Mechanism of high-resolution STM/AFM imaging with functionalized tips
High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing.We present a...
BM - Fyzika pevných látek a magnetismus
- 2014 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
AFM a nanobiotechnologie
Introduction to AFM, imaging techniques, force spectroscopy, biomechanical mapping.
Biological sciences
- 2016 •
- W •
- Link
Rok uplatnění
W - Uspořádání workshopu
Výsledek na webu
AFM - the tool for surface microscopy and nanotechnology
Application of AFM for surface imaging and fabrication of nanostructures.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
Image Processing in Selfacting Production of Tip for AFM Microscopes
This paper describes image processing used to acquire data important for AFM tip fabrication. The main goal is to measure distances between parts during all fabrication steps. Camera distortion correction and calibration along with ...
JB - Senzory, čidla, měření a regulace
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
Submolecular resolution imaging of molecules by atomic force microscopy: the influence of the electrostatic force
The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understa...
BM - Fyzika pevných látek a magnetismus
- 2016 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
AFM-in-SEM LiteScope™
to develop an AFM microscope with 'fast imaging' and adaptive scanning capability of a specific device and its features. This product data sheet describes the AFM-in-SEM LiteScope™, which is a unique atomic force microscop...
Nano-technology
- 2023 •
- O
Rok uplatnění
O - Ostatní výsledky
Atomic force microscopy studies of cross-sections of columnar thin films
of the film in the cross-section does not cause an obstacle for scanning the AFM images that the micro-hardness contrast mode of AFM is the more useful technique for imaging on silicon wafers is studied using two ...
BM - Fyzika pevných látek a magnetismus
- 2007 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Nanobubble "Snapshot" on a Polymer Matrix Ex situ Imaging of Polymer Imprints of Gaseous Nanobubbles
of the nanobubble existence, which can be imaged ex post by ex sítu AFM. Thus, complicated imaging in liquids and nanobubble interaction with the AFM tip can be avoided. properties impose limitations to the select...
CG - Elektrochemie
- 2015 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Detection of Elliptical Particles in Atomic Force Microscopy Images
In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; the measured heights are represente...
IN - Informatika
- 2011 •
- D
Rok uplatnění
D - Stať ve sborníku
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