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Instrument for thin film diagnostics by UV spectroscopic reflectometry
Instrument for thin film diagnostics by UV spectroscopic reflectometry...
BM - Fyzika pevných látek a magnetismus
- 2004 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Instrument for Thin Films Diagnostics by UV Spectroscopic Reflectometry
A system for large area thin film homognity diagnostics by spectroscopic reflectometry.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
Application of spectroscopic reflectometry to the study of elastohydrodynamic lubrication
This paper contains an application of spectroscopic reflectometry to the study of central thickness of lubrication film.
JR - Ostatní strojírenství
- 2009 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
reflectometry at near normal incidence and spectroscopic imaging reflectometry applied by imaging reflectometry. The method is illustrated by means of the complete optical......
BH - Optika, masery a lasery
- 2011 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Photon Counting Reflectometry with Millimeter Resolution
Photon Counting Reflectometry with Millimeter Resolution.
JB - Senzory, čidla, měření a regulace
- 2003 •
- O
Rok uplatnění
O - Ostatní výsledky
Optical low-coherence reflectometry.
Original scientific paper dealing with Optical low-coherence reflectometry.
JA - Elektronika a optoelektronika, elektrotechnika
- 1998 •
- D
Rok uplatnění
D - Stať ve sborníku
Application of spectroscopic reflectometry to the study of tribological processes in mikromechanisms
The paper is devoted to the study of thin lubrication film formation within non-conformal contact. Spectroscopic reflectometry is used to observe not only the changes in the film thickness but also in the lubricant properties....
JR - Ostatní strojírenství
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Experimental Setup for Measuring Moisture Profiles in Building Materials Using Time-Domain Reflectometry
In this paper, we present the time domain reflectometry technique for moisture measurement as a relatively new method for building materials with a good potential for the application in both laboratory and in situ conditions....
JJ - Ostatní materiály
- 2005 •
- D
Rok uplatnění
D - Stať ve sborníku
White-light spectral interferometry and reflectometry to measure thickness of thin films
A white-light spectral interferometric technique and reflectometry are used for measuring the thickness of a SiO2 thin film grown by thermal oxidation on a Si substrate is presented....
BH - Optika, masery a lasery
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Upgrade of the COMPASS tokamak microwave reflectometry system with I/Q modulation and detection.
The microwave reflectometry system on COMPASS tokamak uses the frequency modulated continuous wave (FM-CW) in the K and Ka bands. The fast swept synthesizer for the density profile reconstruction. The homodyne detection limits the use of
Nuclear related engineering; (nuclear physics to be 1.3);
- 2017 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
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