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Precise phase-modulation generalized ellipsometry of anisotropic samples
A procedure for the measurement of the generalized ellipsometric angles using a phase-modulation spectroscopic ellipsometer is described. Generalized phase-modulation ellipsometry combined with zone averaging enables precis...
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines
In this paper, the authors present the characterization experiments of a 20fs vacuum ultraviolet beam from a high harmonic generation source. The beam hits ultraviolet time-resolved user station dedicated to ellipsometry. The high h...
Optics (including laser optics and quantum optics)
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Magneto-optical ellipsometry of systems containing thick layers
ellipsometry are discussed. Simplification of the general formalism is presented vectors. The MO ellipsometry angles rotation and ellipticity are expressed in terms......
BH - Optika, masery a lasery
- 2004 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Selective sensitivity of ellipsometry to magnetic nanostructures
Magneto-optic (MO) ellipsometry of ferromagnetic materials is extremely sensitive to ultra-thin films, multilayers, and nanostructures. It gives a possibility to measure all components of the magnetization vector in the frame of the magneto-...
BM - Fyzika pevných látek a magnetismus
- 2011 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
In-situ ellipsometry of surfaces and thin films
In-situ ellipsometry of surfaces and thin films...
BM - Fyzika pevných látek a magnetismus
- 2000 •
- D
Rok uplatnění
D - Stať ve sborníku
Spectroscopic ellipsometry: its accuracy and potenciality
Accuracy and potenciality of the spectroscopic ellipsometry are discussed.
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Ellipsometry in characterization of thin films
In this paper the principles of ellipsometry together with a description of important ellipsometric techniques are briefly presented. A general classification of the ellipsometric methods significant from the practical point of view...
BM - Fyzika pevných látek a magnetismus
- 2005 •
- D
Rok uplatnění
D - Stať ve sborníku
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
(PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determinat...
Particles and field physics
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
(PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determinat...
Particles and field physics
- 2022 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Magnetooptic ellipsometry in multilayers at arbitrary magnetization
Magnetooptic ellipsometry in multilayers at arbitrary magnetization...
BM - Fyzika pevných látek a magnetismus
- 2001 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
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