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Backscattered electron imaging using the improved YAG scintillation detector
Backscattered electron imaging using the improved YAG scintillation detector.
JA - Elektronika a optoelektronika, elektrotechnika
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope
This paper deals with imaging by means of backscattered electrons in the high resolution scanning electron microscopy. Possible backscattered electrons detection and disadvantages are discussed an...
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope
Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scanning electron microscope. Various systems for the detection of backscattered electrons are outli...
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- D
Rok uplatnění
D - Stať ve sborníku
Imaging of Non-Conductive Samples by Means of Low Energy Backscattered Electrons in SEM
by means of backscattered electrons are proposed as methods of suppression of charging artifacts in the image. Newly developed detector of backscattered electrons for the low energy SEM is described and <...
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- D
Rok uplatnění
D - Stať ve sborníku
Detection of Backscattered Electrons in Low Voltage Scanning Electron Microscopy
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scanning electron microscopy (LV SEM). The BSE energy is 3 keV of sufficient signalfor the image. It is necessary to acce...
JA - Elektronika a optoelektronika, elektrotechnika
- 2005 •
- D
Rok uplatnění
D - Stať ve sborníku
About the information depth of backscattered electron imaging
he information depth of imaging with backscattered electrons in the scanning electron microscope was measured directly by comparison of a planar view of a steel sample with buried precipitates with an image
Mechanical engineering
- 2017 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
About the information depth of backscattered electron imaging
The information depth of imaging with backscattered electrons in the scanning electron microscope was measured directly by comparison of a planar view of a steel sample with buried precipitates with an image
Materials engineering
- 2017 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Scintillation detector of low energy backscattered electrons
New scintillation detector of backscattered electrons was developed of the backscattered electrons to the energy at which the number of photons sufficient for a quality image is produced in the scintillato...
JA - Elektronika a optoelektronika, elektrotechnika
- 2006 •
- X
Rok uplatnění
X - Nezařazeno
New scintillation detector of backscattered electrons lor the low voltage SEM
The new scintillation detector of backscattered electrons that is capable of working at primary beam energy as low as 0.5 keV is introduced. Low energy backscattered electrons are accelerated in order to generate a...
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Nanometer resolution of backscattered electron image.
Annotation not available...
JA - Elektronika a optoelektronika, elektrotechnika
- 1994 •
- D
Rok uplatnění
D - Stať ve sborníku
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