Filters
Spectroscopic ellipsometry: its accuracy and potenciality
Accuracy and potenciality of the spectroscopic ellipsometry are discussed.
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Magnetooptical and optical spectroscopic ellipsometry of La2/3Sr1/3MnO3 thin films
La2/3Sr1/3MnO3 thin films were investigated using magnetooptical and optical spectroscopic ellipsometry.
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials are presented......
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS
Degradation of PMPSi under teperature and UV light uder UHV conditions studied by XPS and spectroscopic ellipsometry.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
Optical Properties of BST Thin Films by Spectroscopic Ellipsometry and Optical Reflectivity
Optical Properties of BST Thin Films by Spectroscopic Ellipsometry and Optical Reflectivity...
BM - Fyzika pevných látek a magnetismus
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Convergence properties of crytical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Convergence properties of crytical dimension measurements by spectroscopic ellipsometry on gratings made of various materials...
BH - Optika, masery a lasery
- 2007 •
- C
Rok uplatnění
C - Kapitola v odborné knize
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
Standard variable-angle spectroscopic ellipsometry, mapping spectroscopic ellipsometry with microspot and imaging spectroscopic reflectometry are applied to optical characterisation of a thin SiOxCyHz film...
BM - Fyzika pevných látek a magnetismus
- 2014 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Photoinduced phenomena in amorphous As4Se3 pulsed laser deposited thin films studied by spectroscopic ellipsometry
Photoinduced phenomena in amorphous As4Se3 pulsed laser deposited thin films were studied by spectroscopic ellipsometry.
BH - Optika, masery a lasery
- 2009 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Optical properties of As33S67-xSex bulk glasses studied by spectroscopic ellipsometry.
Optical properties of As33S67-xSex bulk glasses were studied by spectroscopic ellipsometry.
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
(PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry...
Particles and field physics
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
- 1 - 10 out of 4 597