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In-situ ellipsometry of surfaces and thin films
In-situ ellipsometry of surfaces and thin films...
BM - Fyzika pevných látek a magnetismus
- 2000 •
- D
Rok uplatnění
D - Stať ve sborníku
Spectroscopic ellipsometry: its accuracy and potenciality
Accuracy and potenciality of the spectroscopic ellipsometry are discussed.
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
(PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determinat...
Particles and field physics
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
(PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determinat...
Particles and field physics
- 2022 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Magnetooptic ellipsometry in multilayers at arbitrary magnetization
Magnetooptic ellipsometry in multilayers at arbitrary magnetization...
BM - Fyzika pevných látek a magnetismus
- 2001 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials are presented......
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Magnetooptical and optical spectroscopic ellipsometry of La2/3Sr1/3MnO3 thin films
La2/3Sr1/3MnO3 thin films were investigated using magnetooptical and optical spectroscopic ellipsometry.
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Magneto-optic ellipsometry in exchange-coupled films
Magneto-optic ellipsometry in exchange-coupled films...
BM - Fyzika pevných látek a magnetismus
- 2002 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS
Degradation of PMPSi under teperature and UV light uder UHV conditions studied by XPS and spectroscopic ellipsometry.
BM - Fyzika pevných látek a magnetismus
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
2nd ELIps Workshop
-optical ellipsometry (ELIps) End-station of ELI Beamlines. This end-station is part. It is an innovative project that plans to integrate the most advanced ellipsometry techniques into one instrument. The Czech and international
Fluids and plasma physics (including surface physics)
- 2017 •
- W
Rok uplatnění
W - Uspořádání workshopu
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