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Precise phase-modulation generalized ellipsometry of anisotropic samples
A procedure for the measurement of the generalized ellipsometric angles using a phase-modulation spectroscopic ellipsometer is described. Generalized phase-modulation ellipsometry combined with zone averag...
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Transverse magneto-optical Kerr effect measured using phase modulation
ellipsometry and zone averaging gives high signal typical for modulation techniquesAn ellipsometric configuration for measurement of complex transverse magneto-optical Kerr effect is described that uses photoelastic modulator
BH - Optika, masery a lasery
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Null ellipsometer with phase modulation
A new null ellipsometer is described that uses photoelasticmodulator (PEM). The phase modulation adds a good signal-to-noiseratio, high sensitivity, and linearity and the polarizer-PEMsystem, for which the first and second harmonics...
BH - Optika, masery a lasery
- 2004 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Influence of component imperfection on null ellipsometry with phase modulation
modulator (PEM). The phase modulation adds a good signal-to-noise ratio, high of modulator frequency cross the zeros. In this paper we discuss influence of component angle error of compensator and modulator
BH - Optika, masery a lasery
- 2005 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
of polarized light reflection techniques for the characterization of phase-change materials (PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well ...
Particles and field physics
- 2020 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
of polarized light reflection techniques for the characterization of phase-change materials (PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well ...
Particles and field physics
- 2022 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
-uniform SiOxCyHz thin films using phase-modulated ellipsometry.A theoretical approach for including considerable thickness non-uniformity of thin films into the formulae employed within variable-angle spectroscopic ell...
BH - Optika, masery a lasery
- 2011 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Optical Properties and Phase Change Transition in Ge2Sb2Te5 Flash Evaporated Thin Films Studied by Temperature Dependent Spectroscopic Ellipsometry.
Optical properties and phase change transition in Ge2Sb2Te5 flash evaporated thin films were studied by temperature dependent spectroscopic ellipsometry....
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Spectroscopic ellipsometry of anodized layer on single crystal InAsSb layer grown by melt epitaxy
Anodized layers on InAsSb, InSb, and InAs surfaces are characterized using phase modulation spectroscopic ellipsometry in a wide spectral range from 0.6 to 6.5 eV. Single crystal InAs0.04Sb0.94 layer was grown using melt-ep...
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric da...
Optics (including laser optics and quantum optics)
- 2009 •
- Jimp
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
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