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Numerical correction of topography artifacts in scanning thermal microscopy
A numerical model based on finite element method has been used for simulation of the measurement process using scanning thermal microscopy. As a result, thermal conductivity of carbon nanotubes has been determined....
JB - Senzory, čidla, měření a regulace
- 2015 •
- D
Rok uplatnění
D - Stať ve sborníku
Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures
In this article, the results of the scanning thermal microscopy (SThM) analysis of artificial structures such as microchip surfaces and solar cell contacts are presented. It is shown that in the absence of surface roughness...
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy
Scanning thermal microscopy (SThM) is a scanning probe microscopy technique for mapping temperature and thermal properties of solid surfaces with very high resolution in the past and it delivers b...
JB - Senzory, čidla, měření a regulace
- 2014 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Large area scanning thermal microscopy and infrared imaging system
This paper describes two calibrated methods to determine the temperature map of micro- and nano- devices.
Nano-processes (applications on nano-scale); (biomaterials to be 2.9)
- 2019 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Scanning thermal microscopy - theory and applications
In this article the theoretical background and some results of the scanning thermal microscopy analysis of artifical structures such as microchip surfaces, roughness and other topographical features can influence the th...
BM - Fyzika pevných látek a magnetismus
- 2005 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
SPM workshop 2017 Seminář o metodách blízkého pole
Pravidelný mezinárodní seminář zaměřený na metody rastrovací sondové mikroskopie.
Nano-technology
- 2017 •
- W •
- Link
Rok uplatnění
W - Uspořádání workshopu
Výsledek na webu
Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy
We present an approach for simulating topography related artefacts in local thermal conductivity measurements using Scanning Thermal Microscopy (SThM), based on an assumption of diffusive heat transfer between the ...
Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)
- 2017 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Porous Silicon Nanowires: Evaluation of Thermal Properties By a Vamas Interlaboratory Comparison on Scanning Thermal Microscopy
quantitatively the thermal properties of arrays of silicon nanowires measuring periodicity, diameter and height, effusivity and thermal conductance using scanning electron microscopy (SEM), atomic force micros...
Nano-materials (production and properties)
- 2024 •
- O •
- Link
Rok uplatnění
O - Ostatní výsledky
Výsledek na webu
The use of scanning probe microscopy for a thin layer quality control
the thin layer deposition. The scanning probe microscopy could be used for the precise characterization thin layer properties. Through the scanning probe microscopy it is easily and thermal conductivity e...
JB - Senzory, čidla, měření a regulace
- 2013 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Open source software for FEM modeling of SThM
Scanning thermal microscopy (SThM) belongs to the large family of scanning probe microscopy (SPM), where the main principle is based on measurement a certain the desired property in ideal case would be the...
JB - Senzory, čidla, měření a regulace
- 2012 •
- D
Rok uplatnění
D - Stať ve sborníku
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