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´Sub-atomic´ resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study
Based on first-principles (DFT) calculations, we explain the origin of apparent sub-atomic features observable on the Si(111)-7x7 surface with a non-contact atomic force microscope (AFM) in terms of the AFM tip str...
BM - Fyzika pevných látek a magnetismus
- 2011 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Atomic Force Microscopy and its Application at Nanoparticles and Surface Study
The atomic force microscope (AFM) belongs to the new family of scanning probe microscopes (SPM). Contribution is a review of our applications of AFM Explorer at surface study of solid conductive and non-conductive ...
JJ - Ostatní materiály
- 2002 •
- D
Rok uplatnění
D - Stať ve sborníku
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to loca...
BM - Fyzika pevných látek a magnetismus
- 2010 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Determination of surface roughness Ti alloys with atomic force microscope.
Roughness measurement using atomic force microscope (AFM) in the evaluation of surface Ti alloys.
JK - Koroze a povrchové úpravy materiálu
- 2014 •
- Vsouhrn
Rok uplatnění
Vsouhrn - Souhrnná výzkumná zpráva
Atomic force microscopy in research and education
This contribution deals with the principle of the atomic force microscope and its employment in various branches of science and technology....
BM - Fyzika pevných látek a magnetismus
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
Atomic Force Microscopy
The atomic force microscope (AFM) belongs to the new family of scanning probe microscopes (SPM) which originated in the invention of the scanning tunnelling microscope. In the AFM, a sharp probing tip scan...
JB - Senzory, čidla, měření a regulace
- 2001 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Internal structure of mixed phase hydrogenated silicon thin films made at 39 degrees
A combined cross-sectional transmission electron microscope (XTEM) and atomic force microscope (AFM) study of thin silicon films deposited at 39 degrees shows isolated conically shaped crystalline conglomerates emb...
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Modification of polycarbonate and polypropylene surfaces by argon ion cluster beams.
The irradiated surface were investigated by surfometer (profilometer), atomic force microscope, contact angle measurements and X-ray photoelectron spectroscopy....
BM - Fyzika pevných látek a magnetismus
- 2001 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Reversal of atomic contrast in scanning probe microscopy on (111) metal surfaces
We studied the origin of atomic contrast on Cu(111) and Pt(111) surfaces probed by a non-contact atomic force microscope and scanning tunnelling microscope. First the short-range attractive atomic...
BM - Fyzika pevných látek a magnetismus
- 2012 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Here, we report the assembling of complex atomic patterns at room temperature by the vertical interchange of atoms between the tip apex of an atomic force microscope and a semiconductor surface....
BM - Fyzika pevných látek a magnetismus
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
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