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55 997 (0,171s) •

Result

X-ray reflectometry and diffuse scattering

Presentation of methods of x-ray reflectivity and diffuse scattering: from basic principles to applications.

BM - Fyzika pevných látek a magnetismus

  • 2007
    • •
  • A
Result

Neutron scattering study of ferroelectric Sn2P2S6 under pressure

dependence of the anisotropic quasielastic diffuse scattering suggests that polarizationFerroelectric phase transition in the semiconductor Sn2P2S6 single crystal has been studied by means of neutron scattering. The observ...

BM - Fyzika pevných látek a magnetismus

  • 2012
    • •
  • Jx
    • •
  • Link
Result

Study of submicrocrystalline materials by diffuse scattering in transmitted wave

Study of submicrocrystalline materials by diffuse scattering in transmitted wave...

BM - Fyzika pevných látek a magnetismus

  • 2003
    • •
  • C
Result

Diffuse x-ray scattering from inclusions in ferromagnetic Ge1-xMnx layers

Diffuse x-ray scattering from inclusions in ferromagnetic Ge1...

BM - Fyzika pevných látek a magnetismus

  • 2008
    • •
  • Jx
Result

Diffuse X-ray scattering from graded SiGe/Si layers (Article No. 66004)

Diffuse X-ray scattering from graded SiGe/Si layers...

BM - Fyzika pevných látek a magnetismus

  • 2008
    • •
  • Jx
Result

Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave

Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave...

BM - Fyzika pevných látek a magnetismus

  • 2002
    • •
  • D
Result

Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave

Study of submicrocrystalline materials by conventional powder diffraction and diffuse scattering in transmitted wave...

BM - Fyzika pevných látek a magnetismus

  • 2004
    • •
  • Jx
Result

Diffuse X-ray scattering from GaN/SiC (0001) thin films

Diffuse X-ray scattering from GaN/SiC (0001) thin films...

BM - Fyzika pevných látek a magnetismus

  • 2006
    • •
  • Jx
Result

Diffuse X-Ray Scattering from Semiconductor Nanostructures

X-ray scattering methods are frequently used for the investigation of semiconductor nanostructures. From the distribution reciprocal space of diffusely scattered intensity, it is possible to determine the spatial correlatio...

BM - Fyzika pevných látek a magnetismus

  • 2009
    • •
  • C
Result

High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers

High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers...

BM - Fyzika pevných látek a magnetismus

  • 2004
    • •
  • Jx
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