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Theory of sampling and quantizing of an image signal in the digital electronic imaging systems.
The present article contains the methematical interpretation of sampling and quantizing of an image signal in the digital electronic imaging systems with pixel sampling lattice of CCD type inside their optoelectronic object...
BH - Optika, masery a lasery
- 2003 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Mathematical intepretation of the recovery of a sampled and quantized image-signal into the continuously distributed, registered and observed form in the digital electronic imaging systems
The article contains the mathematical interpretation of fundamental operations connected with recovery of a sampled and quantized image-electrical signal in the digital electronic imaging systems with CCD pixel photodetecto...
BH - Optika, masery a lasery
- 2003 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Optical Near-Field Electron Microscopy
electron microscopy (ONEM) is proposed, an imaging technique that combines noninvasive using a planar photocathode. The electron flux is imaged using low-energy electronThe imaging of dynamical p...
Physical chemistry
- 2021 •
- Jimp •
- Link
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Zoom Lens Imaging System for Electron Beam Microscope
The aim of this study is to provide a preliminary design of a zoom imaging system for electron beam microscopy with a respect to the given mechanical and environmental restrictions....
BH - Optika, masery a lasery
- 2012 •
- Vsouhrn
Rok uplatnění
Vsouhrn - Souhrnná výzkumná zpráva
High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope
Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scanning electron microscope. Various systems for the detection of backscattered electrons are outlined. Special atten...
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- D
Rok uplatnění
D - Stať ve sborníku
The Dopant Contrast ? A Challenge to Electron Microscopy
Results obtained when imaging doped areas in silicon by means of various electron microscopical methods are reviewed. These include secondary electron imaging in the conventional SEM and SEM equipped with the catho...
JA - Elektronika a optoelektronika, elektrotechnika
- 2006 •
- D
Rok uplatnění
D - Stať ve sborníku
Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD
observation area. The coupling of electron channelling contrast imaging (ECCI) with EBSD structures is commonly performed by transmission electron microscopy. TEM presents some destructive structural characterisation techn...
JJ - Ostatní materiály
- 2016 •
- D •
- Link
Rok uplatnění
D - Stať ve sborníku
Výsledek na webu
Backscattered electron imaging using the improved YAG scintillation detector
Backscattered electron imaging using the improved YAG scintillation detector.
JA - Elektronika a optoelektronika, elektrotechnika
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
Imaging of dopants under presence of surface ad-layers
Scanning electron microscopy is widely used for imaging of semiconductor structures. Image contrast between differently doped areas is observable in the secondary electron emission. Quantitative relation exists bet...
JA - Elektronika a optoelektronika, elektrotechnika
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
Non-contact electron optics system for coincidence imaging analysis
An electron imaging system has been developed for spatial information electron optic system to focus coincidence electrons for imaging measurements sample is scanned at once where the electrons ar...
BG - Jaderná, atomová a molekulová fyzika, urychlovače
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
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