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Adaptation of scanning electron microscope to environmental scanning electron microscope.
This paper deals with adaptation of the scanning electron microscope (SEM) to the environmental scanning electron microscope (ESEM). It focuses especially to the construction and assembly of the differential pumpin...
JA - Elektronika a optoelektronika, elektrotechnika
- 2003 •
- D
Rok uplatnění
D - Stať ve sborníku
Scintillation secondary electron detector for environmental scanning electron microscope
This article deals with a scintillation detector of secondary electrons for environmental scanning electron microscope. The influence of the change of voltages on electrode system of the detector on secondary electrons<...
JA - Elektronika a optoelektronika, elektrotechnika
- 2008 •
- D
Rok uplatnění
D - Stať ve sborníku
The Scanning Low-Energy Electron Microscope: First Attainment of Diffraction Contrast in the Scanning Electron Microscope.
Original scientific paper dealing with The Scanning Low-Energy Electron Microscope: First Attainment of Diffraction Contrast in the Scanning Electron Microscope....
JA - Elektronika a optoelektronika, elektrotechnika
- 1999 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Scintillationsecondary electron detector for variable pressure scanning electron microscope
This article deals with a scintillation detector of secondary electrons for variable pressure scanning electron microscope. The influence of the change of voltages on electrode system of the detector and on scintillator on ...
JA - Elektronika a optoelektronika, elektrotechnika
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Scintillation secondary electron detector for variable pressure scanning electron microscope
This article deals with a scintillation detector of secondary electrons for variable pressure scanning electron microscope.
JA - Elektronika a optoelektronika, elektrotechnika
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Scintillation secondary electron detector for variable pressure scanning electron microscope
This work deals with optimalization of the electrode system of the experimental secondary electron detector for variable pressure sem for different pressure of vater vapours in the specimen chamber....
JA - Elektronika a optoelektronika, elektrotechnika
- 2010 •
- D
Rok uplatnění
D - Stať ve sborníku
Wave-optical contrasts in the scanning electron microscope.
The work deals with study of origin and properties of wave-optical contrasts in the scanning electron microscope with slow electrons....
JA - Elektronika a optoelektronika, elektrotechnika
- 2002 •
- D
Rok uplatnění
D - Stať ve sborníku
Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy
For examination of thin films by transmitted electrons (TE) the Transmission Electron Microscope is used at primary beam energies in hundreds of keV. The Scanning Electron Microscopes (SEM) utilize reflect...
JA - Elektronika a optoelektronika, elektrotechnika
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Scanning electron microscope for surface study
Scanning electron microscope for surface study with detection of slow and Auger electrons was built. Device arises from renovation of obsolete ultrahigh vacuum scanning electron microscope Tesla BS 350. Va...
BM - Fyzika pevných látek a magnetismus
- 2005 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Differentially plumping chamber for electron microscope
Differentially pumping chamber is situated bellow the objective lens of scanning electron microscope and above the specimen chamber of this microscope. It is separately pumped....
JA - Elektronika a optoelektronika, elektrotechnika
- 2007 •
- Gfunk
Rok uplatnění
Gfunk - Funkční vzorek
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