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Crystallinity of the mixed phase silicon thin films by Raman spectroscopy
Raman spectra of the mixed phase silicon films were studied. The 785 nm excitation was found optimal for crystallinity evaluation....
BM - Fyzika pevných látek a magnetismus
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
Conductive atomic force microscopy (C-AFM) can be used to probe the structure and local conductivity of the mixed phase silicon thin films with nanometer resolution. Effective medium approximations (EMAs) were used to relat...
BM - Fyzika pevných látek a magnetismus
- 2010 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Internal structure of mixed phase hydrogenated silicon thin films made at 39 degrees
A combined cross-sectional transmission electron microscope (XTEM) and atomic force microscope (AFM) study of thin silicon films deposited at 39 degrees shows isolated conically shaped crystalline conglomerates embedded in an amorphous p...
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Decomposition of mixed phase silicon Raman spectra
for excitation wavelength highly absorbed in the mixed phase silicon layers.Series of Raman spectra were measured for microcrystalline silicon thin film with variable crystallinity. Five sets of Raman spectra (cor...
BM - Fyzika pevných látek a magnetismus
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
C-AFM and X-TEM: studies of mixed-phase silicon thin films
Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques....
BM - Fyzika pevných látek a magnetismus
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Absorption and photoluminescence spectra of the hydrogenated amorphous silicon with embedded silicon nanoparticles
in the sample with mixed phase of amorphous matrix and isolated silicon nanoparticles in the mixed amorphous and crystalline phase as confirmed by the high resolutionSilicon nanoparticles (NPs) e...
BM - Fyzika pevných látek a magnetismus
- 2016 •
- O
Rok uplatnění
O - Ostatní výsledky
Passivating electron contact based on highly crystalline nanostructured silicon oxide layers for silicon solar cells
with a mixed-phase silicon oxide/silicon layer.We present a novel passivating contact structure based on a nanostructured silicon-based layer. Traditional poly-Si junctions feature excellent junction char...
BM - Fyzika pevných látek a magnetismus
- 2016 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Four Wave Mixing in Silicon Hybrid and Silicon Heterogeneous Micro Photonic Structures
Paper deals with both theoretical estimates and experimental results for four wave mixing conversion efficiencies in silicon hybrid and silicon heterogeneous structures....
BH - Optika, masery a lasery
- 2012 •
- Jx •
- Link
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Characterization of mixed phase silicon by Raman spectroscopy
We have examined the common methods for determination of the crystallinity. Crystallinity values obtained from Raman spectra excited by Ar+ laser green line (514.5 nm) for a special sample with a profile of structure from amorphous to fully microcrys...
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Microstructure of hydrogenated silicon thin films prepared from silane diluted with hydrogen
density of the films decreases. The mc-Si:H films are mixed-phase void-rich materials on silicon thin films deposited by plasma-enhanced chemical vapor deposition (PECVD) from in an inhomogeneous growth during which the ma...
BM - Fyzika pevných látek a magnetismus
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
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