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137 981 (0,219s)

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COMPAS III - compressed test pattern sequencer

the test sequence for a given circuit by compressing a test data created by an external ATPG. The resulting compressed test sequence can be transmitted through a narrow. The compression is based ...

JC - Počítačový hardware a software

  • 2009
  • R
Result

COMPAS - compressed test pattern sequencer

of the circuit description. It Compresses the test sequence created by an external ATPG. The resulting compressed test sequence can be transmitted through a narrow Test Access Mechanism into the teste...

JC - Počítačový hardware a software

  • 2008
  • X
Result

Test pattern compression based on pattern overlapping and broadcasting

increase rapidly. This problem is usually solved by using various test compression techniques. Test compression involves storing compressed test data in the ATE, test data transfer in

JC - Počítačový hardware a software

  • 2011
  • D
Result

SAT-Compress

The SAT-Compress tool for test patterns compression is based a dedicated SAT-based ATPG (Automatic Test Pattern Generator). The compression is achived by test patterns overlapping during the t...

JC - Počítačový hardware a software

  • 2012
  • R
  • Link
Result

Efficient Tas Pattern Compression Method Using Hard Fault Preferring

This paper describes new compression method that is used for test pattern compaction and compression in algorithm called COMPAS, which utilizes a test data compression method based on pattern overlapping. ...

JC - Počítačový hardware a software

  • 2008
  • D
Result

COMPAS and Other Test Pattern Compression Methods

The paper is about COMPAS and Other Test Pattern Compression Methods.

JC - Počítačový hardware a software

  • 2007
  • D
Result

Device for compression test of a thin plate

Device allows to execute a compression test of a thin sheet made of metal materials.

JM - Inženýrské stavitelství

  • 2015
  • Gfunk
  • Link
Result

COMPAS - System for Finding of a Compress Test Pattern Sequence

The paper describes COMPAS - system for finding of a compress test pattern sequence.

JA - Elektronika a optoelektronika, elektrotechnika

  • 2003
  • D
Result

COMPAS and Other Test Pattern Compression Methods

This paper demonstrates several test pattern compression techniques of test pattern overlapping which is implemented in the COMPAS compression tool because this compression method is relatively efficient a...

JC - Počítačový hardware a software

  • 2007
  • D
Result

TEST PATTERNS COMPRESSION TECHNIQUES BASED ON SAT SOLVING FOR SCAN-BASED DIGITAL CIRCUITS

In the paper we propose a new method of test patterns compression based on SAT (SATisfiability) solving. By test patterns compression we can dramatically decrease test memory requirements for test...

JC - Počítačový hardware a software

  • 2009
  • D
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