New possibilities of X-ray analytical methods in the forensic science field

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F25%3AN0000109" target="_blank" >RIV/00007064:K01__/25:N0000109 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

New possibilities of X-ray analytical methods in the forensic science field

Original language description

peer-reviewed article in conference proceedings Kotrlý M., Uher J., Bohacova J., Turková I., Cejka P.: New possibilities of X-ray analytical methods in the forensic science field. ANZFSS 2025 Abstract Book, p.231, Melbourne, 2025. X-ray methods are widely employed in forensic science for a broad range of expert analyses. These include both micro-analytical techniques—such as X-ray diffraction analysis/microanalysis (XRD/mXRD), energy/wavelength-dispersive microanalysis (EDS/WDS, XRF)—as well as imaging techniques, such as X-ray imaging and computed tomography (CT), alongside a variety of other methods. These techniques are used across a wide spectrum of forensic analysis, serving to identify materials and provide insights into their internal structure, composition, etc. This includes expert analyses in chemistry, metallography, defectoscopy and industrial engineering (explosions, industrial accidents, vehicle accidents, etc.). Conventional instrumentation often faces challenges regarding the size, accessibility, the need to disassemble components, or in situ analysis. Similar issues arise, for instance, with industrial CT systems. As a result, a multimodal, non-destructive robotic analysis system has been developed for the complex characterisation and inspection of both 2D and 3D objects. The system is based on multi-robot imaging platform with six-axis robotic arms and the system measures nearly all conventional 2D and 3D trajectories of X-ray imaging with precisely calibrated and repeatable geometrical accuracy, leading to a spatial resolution of up to 50 µm. The system facilitates non-destructive examination of a wide range of samples with complex curves. The new generation of X-ray imaging detectors provides high image quality with spatial resolution in the micrometric range for both 2D and 3D imaging. The broad capabilities of X-ray imaging are complemented by X-ray fluorescence point analysis and mapping, multispectral imaging, and multispectral X-ray diffraction analysis. This system is also used to address the growing need for the analysis of counterfeit works of art, where non-destructive, comprehensive multimodal analysis is required at least as an initial step. The comprehensive system finds applications in various fields of forensic material analysis.

Czech name

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Czech description

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Type

O - Miscellaneous

CEP classification

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OECD FORD branch

20204 - Robotics and automatic control

Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2025

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů