Near-?eld scanning optical microscopy studies of thin ?lm surfaces and interfaces

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F08%3A%230000297" target="_blank" >RIV/00177016:_____/08:#0000297 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Near-?eld scanning optical microscopy studies of thin ?lm surfaces and interfaces

Original language description

In this article, the results of the modeling of topography related artifacts appearing in near-?eld scanning optical microscopy measurements are presented. The results obtained for near-?eld scanning optical microscope operation in re?ection mode with off-axis far ?eld detector position are compared with experimental results. It is shown that the chosen numerical method ? Finite Difference in Time Domain method (FDTD) ? can be used for ef?cient modeling of main topography related artifact. It is also seen that the far ?eld detector position can have large in?uence on the resulting re?ection mode optical images.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

—

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Surface Science

ISSN

0169-4332

e-ISSN

—

Volume of the periodical

254

Issue of the periodical within the volume

12/2007

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

4

Pages from-to

—

UT code for WoS article

—

EID of the result in the Scopus database

—