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Near-field scanning optical microscopy studies of thin film surfaces and interfaces

Result description

In this article, the results of the modeling of topography related artifacts appearing in near-field scanning optical microscopy measurements are presented. The results obtained for near-field scanning optical microscope are compared with experimental results. It is shown that the chosen numerical method - Finite Difference in Time Domain method(FDTD)-can be used for efficient modeling of main topography related artifact.

Keywords

NSOMFDTDimage artifacs

The result's identifiers

Alternative languages

  • Result language

    angličtina

  • Original language name

    Near-field scanning optical microscopy studies of thin film surfaces and interfaces

  • Original language description

    In this article, the results of the modeling of topography related artifacts appearing in near-field scanning optical microscopy measurements are presented. The results obtained for near-field scanning optical microscope are compared with experimental results. It is shown that the chosen numerical method - Finite Difference in Time Domain method(FDTD)-can be used for efficient modeling of main topography related artifact.

  • Czech name

    Studium povrchů tenkých vrstev a rozhraní pomocí rastrovací optické mikroskopie v blízkém poli

  • Czech description

    V tomto článku prezentujeme výsledky modelování topografie artefaktů v optické rastrovací mikroskopii v blízkém poli. Výsledky získané rastrováním v blízkém poli optického mikroskopu jsme porovnávali s experimentálními výsledky. Ukazuje se, že vybranou numerickou metodu FDTD lze použít pro efektivní mapování artefaktů.

Classification

  • Type

    Jx - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BL - Plasma physics and discharge through gases

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science

  • ISSN

    0169-4332

  • e-ISSN

  • Volume of the periodical

    254

  • Issue of the periodical within the volume

    12

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    4

  • Pages from-to

    3681-3684

  • UT code for WoS article

  • EID of the result in the Scopus database

Basic information

Result type

Jx - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

Jx

CEP

BL - Plasma physics and discharge through gases

Year of implementation

2008