Measurement System for DC Characterization of Low Resistance Standards
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F09%3A%230000250" target="_blank" >RIV/00177016:_____/09:#0000250 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Measurement System for DC Characterization of Low Resistance Standards
Original language description
This paper describes a measurement system for DC characterization of low resistance standards (below 0,1 ?) in wide current level (from 1 A up to 100 A). DC characterization of such standard includes direct resistance measurements, temperature coefficient measurements and current level dependence (power coefficient) measurement with uncertainties at ppm level.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of NCSL International Workshop and Symposium
ISBN
1-58464-063-4
ISSN
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e-ISSN
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Number of pages
9
Pages from-to
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Publisher name
NCSL International
Place of publication
San Antonio, Texas, USA
Event location
San Antonio, Texas, USA
Event date
Jan 1, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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