Measurement System for High Current Shunts DC Characterization at CMI
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F10%3A%230000244" target="_blank" >RIV/00177016:_____/10:#0000244 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Measurement System for High Current Shunts DC Characterization at CMI
Original language description
This paper describes a measurement system for DC characterization of high current shunts (below 0,1 Ohm) in wide current level (from 5 A up to 100 A) built at CMI. DC characterization of such shunt includes direct resistance measurements, temperature coefficient and power coefficient measurement with uncertainties at ppm level.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Conference on Precision Electromagnetic Measurements Digest
ISBN
978-1-4244-6794-5
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
IEEE, 345 E 47th St., New York, NY 10017 USA
Place of publication
Seoul, South Korea
Event location
Seoul, South Korea
Event date
Jan 1, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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