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Non-equidistant scanning approach for millimetre-sized SPM measurements

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F12%3A%230000541" target="_blank" >RIV/00177016:_____/12:#0000541 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.nanoscalereslett.com/content/7/1/213" target="_blank" >http://www.nanoscalereslett.com/content/7/1/213</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1186/1556-276X-7-213" target="_blank" >10.1186/1556-276X-7-213</a>

Alternative languages

  • Result language

    čeština

  • Original language name

    Non-equidistant scanning approach for millimetre-sized SPM measurements

  • Original language description

    Abstract Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local re?nement in order to minimize the amount of information that would be useless in the data processing phase.The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the in?uence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.

  • Czech name

    Non-equidistant scanning approach for millimetre-sized SPM measurements

  • Czech description

    Abstract Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local re?nement in order to minimize the amount of information that would be useless in the data processing phase.The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the in?uence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/FR-TI1%2F241" target="_blank" >FR-TI1/241: Components for nano-diagnostic of length fluctuations, deviation of shapes and surface faults</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nanoscale Research Letters

  • ISSN

    1556-276X

  • e-ISSN

  • Volume of the periodical

    2012

  • Issue of the periodical within the volume

    7

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    7

  • Pages from-to

    213-219

  • UT code for WoS article

  • EID of the result in the Scopus database