Non-equidistant scanning approach for millimetre-sized SPM measurements
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F12%3A%230000541" target="_blank" >RIV/00177016:_____/12:#0000541 - isvavai.cz</a>
Result on the web
<a href="http://www.nanoscalereslett.com/content/7/1/213" target="_blank" >http://www.nanoscalereslett.com/content/7/1/213</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1186/1556-276X-7-213" target="_blank" >10.1186/1556-276X-7-213</a>
Alternative languages
Result language
čeština
Original language name
Non-equidistant scanning approach for millimetre-sized SPM measurements
Original language description
Abstract Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local re?nement in order to minimize the amount of information that would be useless in the data processing phase.The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the in?uence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.
Czech name
Non-equidistant scanning approach for millimetre-sized SPM measurements
Czech description
Abstract Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local re?nement in order to minimize the amount of information that would be useless in the data processing phase.The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the in?uence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
<a href="/en/project/FR-TI1%2F241" target="_blank" >FR-TI1/241: Components for nano-diagnostic of length fluctuations, deviation of shapes and surface faults</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanoscale Research Letters
ISSN
1556-276X
e-ISSN
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Volume of the periodical
2012
Issue of the periodical within the volume
7
Country of publishing house
DE - GERMANY
Number of pages
7
Pages from-to
213-219
UT code for WoS article
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EID of the result in the Scopus database
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