Stitching accuracy in large area scanning probe microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU154732" target="_blank" >RIV/00216305:26620/24:PU154732 - isvavai.cz</a>
Alternative codes found
RIV/00177016:_____/24:N0000143 RIV/00216224:14310/24:00137935
Result on the web
<a href="https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13" target="_blank" >https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1361-6501/ad7a13" target="_blank" >10.1088/1361-6501/ad7a13</a>
Alternative languages
Result language
angličtina
Original language name
Stitching accuracy in large area scanning probe microscopy
Original language description
Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
21100 - Other engineering and technologies
Result continuities
Project
<a href="/en/project/8B21006" target="_blank" >8B21006: Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Measurement Science and Technology
ISSN
0957-0233
e-ISSN
1361-6501
Volume of the periodical
35
Issue of the periodical within the volume
12
Country of publishing house
GB - UNITED KINGDOM
Number of pages
12
Pages from-to
125026-125037
UT code for WoS article
001326872200001
EID of the result in the Scopus database
2-s2.0-85206075472