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Realization of the Ultrahigh-Ohmic Resistance Scale at CMI

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F14%3A%230000943" target="_blank" >RIV/00177016:_____/14:#0000943 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/CPEM.2014.6898377" target="_blank" >http://dx.doi.org/10.1109/CPEM.2014.6898377</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/CPEM.2014.6898377" target="_blank" >10.1109/CPEM.2014.6898377</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Realization of the Ultrahigh-Ohmic Resistance Scale at CMI

  • Original language description

    This paper describes realization of the ultrahigh-omic resistance scale in the range from 10 G? up to 100 T? at CMI. The scale realization is based on measurement of standards with different nominal values at various voltage levels, selected in such a way, that same nominal current is preserved during measurement of different standards. Measurement circuit consists of the measured standard, an electrometer and is energized from a voltage calibrator. The described method was used during Supplementary Comparison EURAMET.EM-S32.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on

  • ISBN

    978-1-4799-5205-2

  • ISSN

    0589-1485

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    298-299

  • Publisher name

    IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

  • Place of publication

    New York

  • Event location

    Rio de Janeiro

  • Event date

    Jan 1, 2014

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article