Methods for topography artifacts compensation in scanning thermal microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F15%3A%230001223" target="_blank" >RIV/00177016:_____/15:#0001223 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26110/15:PU114171
Result on the web
<a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2015.04.011</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >10.1016/j.ultramic.2015.04.011</a>
Alternative languages
Result language
angličtina
Original language name
Methods for topography artifacts compensation in scanning thermal microscopy
Original language description
Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. This is pronounced on samples with sharp topographic features, on rough samples and while using larger probes,for example, Wollaston wire-based probes. The topography artifacts can be so high that they can even obscure local thermal conductivity variations influencing the measured signal. Three methods for numerically estimating and compensating for topographicartifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe-sample interaction. A local topography and an estimated probe shapeare used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measure
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
—
Result continuities
Project
—
Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
ULTRAMICROSCOPY
ISSN
0304-3991
e-ISSN
—
Volume of the periodical
155
Issue of the periodical within the volume
srpen
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
7
Pages from-to
55-61
UT code for WoS article
000355211900007
EID of the result in the Scopus database
—