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Methods for topography artifacts compensation in scanning thermal microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F15%3A%230001223" target="_blank" >RIV/00177016:_____/15:#0001223 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26110/15:PU114171

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2015.04.011</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >10.1016/j.ultramic.2015.04.011</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Methods for topography artifacts compensation in scanning thermal microscopy

  • Original language description

    Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. This is pronounced on samples with sharp topographic features, on rough samples and while using larger probes,for example, Wollaston wire-based probes. The topography artifacts can be so high that they can even obscure local thermal conductivity variations influencing the measured signal. Three methods for numerically estimating and compensating for topographicartifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe-sample interaction. A local topography and an estimated probe shapeare used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measure

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    R - Projekt Ramcoveho programu EK

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    ULTRAMICROSCOPY

  • ISSN

    0304-3991

  • e-ISSN

  • Volume of the periodical

    155

  • Issue of the periodical within the volume

    srpen

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    7

  • Pages from-to

    55-61

  • UT code for WoS article

    000355211900007

  • EID of the result in the Scopus database